SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
Hosted on MSN
Cutting-edge imaging and faster algorithms for finding minuscule defects in semiconductor chips
A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results