Since the development of the transmission electron microscope (TEM), scientists have sought ways to improve spatial resolution. With the design of the aberration-correcting lens systems for scanning ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

(Nanowerk News) Electron microscopy enables researchers to visualize tiny objects such as viruses, the fine structures of semiconductor devices, and even atoms arranged on a material surface. Focusing ...

In conventional electron microscopes, performing atomic-resolution observations of magnetic materials is particularly difficult because high magnetic fields are inevitably exerted on samples inside ...

The above image was taken by a Scanning Electron Microscope (SEM) of micron-size Ti02 particles in a polysterene matrix. SEM creates images of a sample by scanning it with a beam of electrons. SEM can ...

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TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020. Development ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...