JTAG Technologies claims to have a test package that reduces the cost of designing built-in test access for boundary-scan testing and on-board device programming. The aim is to remove the need for a ...
In conjunction with FTDILtd, JTAG Technologies has announced a new support package for board-leveland system designers looking to implement a convenient BIT (built-in test)access strategy for IEEE ...
Future Technology Devices International Ltd. (FTDI Chip) will show off two USB 2.0 mini-modules at the Nuremberg Embedded World show in early March. FT2232H mini module (pictured above) offers two ...
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