Using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), the researchers have been able to show how the electrode degrades during use, when performing a standardised stress ...
They can image a wide range of materials and biological samples with high magnification, resolution, and depth of field, thereby revealing surface structure and chemical composition. Industries like ...
The SMAL lens enables super-resolution imaging for semiconductors with clear resolution of features down to tens of ...
An example of a correlative study between XRM and FIB-SEM has been presented in an earlier study. 1 This article will expand the correlation one step beneath the length scale to link FIB-SEM and TEM, ...
Thought LeadersProf. Dariusz Jarzabek & Martina SchenkelProfessor & Applications Development EngineerInstitute of Fundamental Technological Research & ZEISS In this interview, AZoNano speaks with ...
With a so-called cryo plasma-FIB (Plasma Focused Ion Beam) scanning electron microscope with nanomanipulator, Goethe University in Frankfurt (Germany) is expanding its research infrastructure with a ...
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
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