Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Verigy has introduced its Yield Learning Solution, which integrates on-tester, real-time capture and analysis of electrical failures on complex system-on-chip (SOC) devices. The Verigy Yield Learning ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

JinkoSolar’s n-type TOPCon modules have been found to deliver significantly higher energy yield per watt compared to n-type BC modules during a three-month field test. The field test, conducted by TÜV ...